The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Apr. 30, 2002
Chan Moon, Seoul, KR;
Hui-chul Won, Busan, KR;
Tae-hyoung Kim, Kunpo, KR;
Seung-ho Choo, Seoul, KR;
Gi-hong Im, Pohang, KR;
Chan Moon, Seoul, KR;
Hui-Chul Won, Busan, KR;
Tae-Hyoung Kim, Kunpo, KR;
Seung-Ho Choo, Seoul, KR;
Gi-Hong Im, Pohang, KR;
Huconex Co., Ltd., Seoul, KR;
Institute Information Technology Assessment, Daejeon, KR;
Abstract
Disclosed is a VDSL (very high bit-rate digital subscriber line) system on the DMT line coding method basis and a method for determining a length of cyclic prefix samples using the system. The VDSL system comprises a transmitter data including cyclic prefix samples through a channel; a receiver for receiving the data including the cyclic prefix samples; a controller for controlling the transmitter and the receiver to control an initialization operation including handshake, training, channel analysis, and exchange, and a data transmission operation after the initialization operation; and a cyclic prefix sample length estimator for estimating an optimized length of the cyclic prefix sample on the basis of the correlation between the cyclic prefix sample and other data. According to the present invention, since no complex TEQ configuration required when fixing and using the length of the cyclic prefix sample is used, its configuration becomes simpler, and the optimized length of the cyclic prefix sample can be accurately determined.