The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Mar. 03, 2005
Shunji Saruki, Tokyo, JP;
Kenji Inage, Tokyo, JP;
Nozomu Hachisuka, Tokyo, JP;
Hiroshi Kiyono, Tokyo, JP;
Shunji Saruki, Tokyo, JP;
Kenji Inage, Tokyo, JP;
Nozomu Hachisuka, Tokyo, JP;
Hiroshi Kiyono, Tokyo, JP;
TDK Corporation, Chuo-Ku, Tokyo, JP;
Abstract
Testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element depending upon a degree of change in resistance of the TMR element. The degree of change in resistance is determined based upon the first resistance value and the second resistance value.