The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
May. 08, 2002
Wolfgang Weinhold, 97070 Würzburg, DE;
Wolfgang Weinhold, 97070 Würzburg, DE;
Other;
Abstract
A method and apparatus for optically examining an object in a contactless manner, in which light successively impinges upon the surface of an object being examined. The different sources of light strike the object surface at different angles of incidence and reflect off the surface and are then able to be measured by an image sensor which produces a plurality of image data sets having different contents. In this way, a first image data set is produced with the incident light from which form-independent or non-topographical characteristics, such as color errors, can be derived. Form-dependent or topographical characteristics, such as scratches, are derived from a second image data set formed with glancing light or oblique light. Before the form characteristics are derived from the first image data set, it is essential that the distorting influences of form-independent characteristics are eliminated from the first image data set via the second image data set. Furthermore, the apparatus is embodied as a portable manual apparatus, which is placed by hand, in an approximately light-permeable manner, on the surface of the fixed object, or is displaced in contact with the surface.