The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2007

Filed:

Apr. 11, 2002
Applicants:

Naohiro Tanno, Yamagata, JP;

Sumio Matsumura, Yamagata, JP;

Michiro Hasegawa, Yamagata, JP;

Yukinori Hino, Yamagata, JP;

Tohru Nakagawa, Yamagata, JP;

Masahiro Kohno, Yamagata, JP;

Inventors:

Naohiro Tanno, Yamagata, JP;

Sumio Matsumura, Yamagata, JP;

Michiro Hasegawa, Yamagata, JP;

Yukinori Hino, Yamagata, JP;

Tohru Nakagawa, Yamagata, JP;

Masahiro Kohno, Yamagata, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high-speed optical delay generating method by a rotation reflector in optical coherence tomography, capable of providing a sectional picture with a sufficiently long depth-direction (Z direction) scanning distance, and an optical coherence tomography device therefor are provided. The device comprises a low-coherence light source (), a half mirror () for splitting light from the low-coherence light source () into two, that is, into object light towards an object (A) to be examined and reference light, a light delay mechanism () for delaying the reference light by means of a rotation reflector (), a fixed mirror () for reflecting/returning the reference light from the light delay mechanism (), the half-mirror () for combining the object light returning from the object (A) to be examined with the reference light returning from the light delay mechanism, and a light detector () for detecting interference light including a heterodyne interference beat signal combined at the half mirror ().


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