The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2007

Filed:

May. 13, 2005
Applicant:

Peter H. Alfke, Los Altos Hills, CA (US);

Inventor:

Peter H. Alfke, Los Altos Hills, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A pulse width measurement system is provided with components in an FPGA so that pulse widths can be measured that are smaller than the frequency limits of the FPGA system clock. For the measurement, an incoming pulse is fed into the FPGA to many (e.g. 32) I/O inputs in parallel. Each parallel input is then provided to a programmable delay device with each delay configured to a different ascending delay value. The input transition time is then detected by converting the outputs from the delay devices into data indicating the timing information. In one embodiment the outputs of the delay devices address data stored in BRAMs for later processing in the FPGA to determine the timing information.


Find Patent Forward Citations

Loading…