The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Dec. 16, 2004
Yuezhen Fan, San Jose, CA (US);
David Mark, San Jose, CA (US);
Eric J Thorne, Santa Cruz, CA (US);
Zhi-min Ling, Cupertino, CA (US);
Yuezhen Fan, San Jose, CA (US);
David Mark, San Jose, CA (US);
Eric J Thorne, Santa Cruz, CA (US);
Zhi-Min Ling, Cupertino, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
The embodiments of the present invention enable a new metal diagnosis pattern based on a production test pattern to quickly identify open and short circuits of metal lines which cannot be probed, such as the long lines of a programmable logic device, and to further isolates the fault location for physical failure analysis. According to one aspect of the invention, a circuit locally drives a plurality of metal long line segments to determine whether a defect in a line is a short circuit, or further to identify the location of an open circuit.