The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Sep. 23, 2004
Method, system and device for microscopic examination employing fib-prepared sample grasping element
George Skidmore, Richardson, TX (US);
Matthew D. Ellis, Allen, TX (US);
Aaron Geisberger, Dallas, TX (US);
Kenneth Bray, Garland, TX (US);
Kimberly Tuck, Dallas, TX (US);
Robert Folaron, Plano, TX (US);
George Skidmore, Richardson, TX (US);
Matthew D. Ellis, Allen, TX (US);
Aaron Geisberger, Dallas, TX (US);
Kenneth Bray, Garland, TX (US);
Kimberly Tuck, Dallas, TX (US);
Robert Folaron, Plano, TX (US);
Zyvex Instruments, LLC, Richardson, TX (US);
Abstract
A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.