The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Jun. 20, 2005
Applicants:
Thomas A. Kocian, Dallas, TX (US);
Richard L. Knipe, McKinney, TX (US);
Mark H. Strumpell, Plano, TX (US);
Inventors:
Thomas A. Kocian, Dallas, TX (US);
Richard L. Knipe, McKinney, TX (US);
Mark H. Strumpell, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/50 (2006.01); H01L 21/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system in which a semiconductor wafer having a plurality of dies is inspected through a visual inspection and/or an electrical test. If certain of the dies on the wafer pass the inspection, then windows are mounted or affixed above those certain dies while they are still a part of the wafer.