The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2007

Filed:

Jun. 02, 2005
Applicants:

Jaime E. Garcia, Jackson, TN (US);

Jeffrey D. Weston, Jackson, TN (US);

Inventors:

Jaime E. Garcia, Jackson, TN (US);

Jeffrey D. Weston, Jackson, TN (US);

Assignee:

Black & Decker Inc., Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21V 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical alignment system. In an embodiment, the system includes an optical emitting device for projecting an optical indicator onto a workpiece surface area. Further, a lateral arm may be coupled to the optical emitting device for supporting such device. In addition, a vertical support is constructed to receive the lateral arm allowing the lateral arm and optical emitting device to cantilever over the workpiece surface area. Moreover, a securing mechanism for securing the vertical support to the workpiece surface area such as a horizontal platform may be included. Additionally, at least one optical emitting device housing which substantially encloses the optical emitting device is present for operationally coupling the optical device to the lateral arm. The at least one optical emitting device housing is configured so that the optical emitting device may cantilever above the workpiece surface area and project a line-of-cut indicator onto the workpiece surface area.


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