The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2007

Filed:

Nov. 06, 2003
Applicants:

Michael John Bracey, Petersfield, GB;

John Joseph Campbell, Alton, GB;

Julie Chen, San Jose, CA (US);

Akira Shibamiya, Los Altos, CA (US);

Bryan Frederick Smith, Morgan Hill, CA (US);

James Zu-chia Teng, San Jose, CA (US);

Inventors:

Michael John Bracey, Petersfield, GB;

John Joseph Campbell, Alton, GB;

Julie Chen, San Jose, CA (US);

Akira Shibamiya, Los Altos, CA (US);

Bryan Frederick Smith, Morgan Hill, CA (US);

James Zu-Chia Teng, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/00 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and article of manufacture, implementing the method, allocates space for a dataset. The dataset has an initial area and zero or more additional allocated areas to provide space for storing the dataset. The size of a new additional area is determined. The new additional area is associated with a new area number, and the size of the new additional area is based on the new area number. Additional space for the dataset is allocated based on the size of the new additional area.


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