The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Nov. 21, 2005
Paul L. Corredoura, Redwood City, CA (US);
Paul L. Corredoura, Redwood City, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A test measurement system and method which uses parallel digital samples of an input measurement signal to determine a trigger point for a predetermined trigger waveform. The system correlates the predetermined trigger waveform with digital samples of the input measurement signal. The result of this correlation is then used to identify a trigger point. Generally the point in time where the trigger waveform has the strongest correlation with the digital samples identifies the desired trigger point. This trigger point is then used to identify the selected measurement data, where the selected measurement data corresponds to the digital samples obtained at the trigger point time.