The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2007

Filed:

Aug. 31, 2004
Applicants:

Hideyuki Kawanabe, Tokyo, JP;

Katsuyoshi Yamaguchi, Tokyo, JP;

Mitsuhiko Saito, Tokyo, JP;

Junzo Sakurai, Tokyo, JP;

Inventors:

Hideyuki Kawanabe, Tokyo, JP;

Katsuyoshi Yamaguchi, Tokyo, JP;

Mitsuhiko Saito, Tokyo, JP;

Junzo Sakurai, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical microscope apparatus selectively arranges a plurality of optical elements in an optical path, and includes: a manual switch unit capable of manually switching any of the plurality of optical elements; a detection unit detecting an arrangement status of manually switched optical elements; a storage unit storing information relating to the arrangement of the plurality of optical elements for each observing method; and an arrangement control unit arranging the plurality of optical elements according to the detection result by the detection unit and the information stored in the storage unit.


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