The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Sep. 13, 2004
George H. Seward, Arlington, MA (US);
George H. Seward, Arlington, MA (US);
Cytyc Corporation, Marlborough, MA (US);
Abstract
A parcentric objective is described, including an objective lens configured to receive an incident ray from a field of view and to translate the incident ray into a translated incident ray, the objective lens substantially aligned across an optical axis, and a wedge prism configured to receive and deflect the translated incident ray into an exiting ray, the wedge prism rotated about the optical axis. A specimen review system is also described, including a specimen stage configured to receive specimens for viewing, a source of illumination providing illumination to the specimen stage, a review scope configured to review specimens positioned on the specimen stage, the review scope comprising a parcentric objective configured to resolve a field of view of the specimen stage.