The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Jan. 05, 2005
Mark A. Zumberge, San Diego, CA (US);
Jonathan Berger, San Diego, CA (US);
Robert L. Parker, San Diego, CA (US);
Matthew Dzieciuch, La Jolla, CA (US);
Mark A. Zumberge, San Diego, CA (US);
Jonathan Berger, San Diego, CA (US);
Robert L. Parker, San Diego, CA (US);
Matthew Dzieciuch, La Jolla, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Techniques and devices for digitally resolving quadrature fringe signals from interferometers such as optical interferometers and interferometer-based sensing devices. In one implementation, two quadrature fringe signals from an interferometer which causes two signals in two signal paths to interfere with each other are sampled to obtain digital data samples from the two quadrature fringe signals. The digital data samples are used to perform a linear least square fitting to establish coefficients for an ellipse traced by the two quadrature fringe signals as a phase difference between the two signal paths changes. A pair of digital data samples are respectively obtained from the two quadrature signals at a given moment and are used to compute a corresponding phase difference between the two signal paths of the interferometer from established coefficients of the ellipse. The coefficient for the ellipse can be updated over time. This digital processing allows for real time processing.