The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Dec. 02, 2004
Applicants:
Kun Zhou, Beijing, CN;
John Michael Snyder, Redmond, WA (US);
Baining Guo, Beijing, CN;
Heung Yeung Shum, Beijing, CN;
Inventors:
Kun Zhou, Beijing, CN;
John Michael Snyder, Redmond, WA (US);
Baining Guo, Beijing, CN;
Heung Yeung Shum, Beijing, CN;
Assignee:
Microsoft Corporation, Redmond, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of performing stretch-driven mesh parameterization. A method of performing stretch-driven mesh parameterization comprising, computing a spectral analysis to parameterize a mesh, and iterating a stretch optimization calculation to further optimize the initial parameterization.