The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2007

Filed:

Nov. 04, 2005
Applicant:

Dae Woon Kang, Lafayette, CO (US);

Inventor:

Dae Woon Kang, Lafayette, CO (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes generating multiple delayed versions of a first signal using at least one first delay line, selecting at least one version of the first signal, and generating a second signal based on the first signal and the at least one selected version of the first signal. The method also includes generating multiple delayed versions of the second signal using at least one second delay line, and selecting at least one version of the second signal. In addition, the method includes modifying selection of the at least one version of the first signal and the at least one version of the second signal to achieve a desired output signal based on the at least one selected version of the second signal. This method could be used in various circuits, such as duty cycle correction circuits, frequency multiplier circuits, and digital multiphase oscillator circuits.


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