The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Dec. 17, 2004
Roman Malendevich, Oceanside, CA (US);
Myles Sussman, San Mateo, CA (US);
Lawrence C. Gunn, Iii, Encinitas, CA (US);
Roman Malendevich, Oceanside, CA (US);
Myles Sussman, San Mateo, CA (US);
Lawrence C. Gunn, III, Encinitas, CA (US);
Luxtera, Inc., Carlsbad, CA (US);
Abstract
This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light to/from the top of the wafer. A wafer level test system uses an optical probe to search for and align with an optical alignment loop. The test system uses a located alignment loop as a reference point to locate other devices on the wafer. The test system tests the operation of selected devices disposed on the wafer. The alignment loop is also used as a reference device for an adjacent device of unknown performance.