The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2007

Filed:

Oct. 01, 2004
Applicants:

Mark A. Proett, Missouri City, TX (US);

James M. Fogal, Houston, TX (US);

Wilson C. Chin, Houston, TX (US);

Prabhakar R. Aadireddy, Cypress, TX (US);

Inventors:

Mark A. Proett, Missouri City, TX (US);

James M. Fogal, Houston, TX (US);

Wilson C. Chin, Houston, TX (US);

Prabhakar R. Aadireddy, Cypress, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and methods for estimating properties of a geologic formation are disclosed. A preferred embodiment includes a method for estimating properties of a geologic formation, comprising the steps of: measuring a property of the formation in two or more directions along a path in the formation; obtaining directional property values for at least one spatial unit along the path in the formation based on the property measurements; and providing an anisotropy estimate of the formation from the obtained directional property values.


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