The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2007

Filed:

Aug. 08, 2003
Applicants:

Nachappa Gopalsami, Naperville, IL (US);

Apostolos C. Raptis, Downers Grove, IL (US);

Inventors:

Nachappa Gopalsami, Naperville, IL (US);

Apostolos C. Raptis, Downers Grove, IL (US);

Assignee:

U Chicago Argonne LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dielectric sensing method and apparatus are provided for detection and classification of chemical and biological materials. Resonance patterns of a sample within a resonator are detected for identifying a shift in resonance frequency and a change of line width before and after introduction of the sample. The identified shift in resonance frequency and change of line width are used for determining a complex dielectric constant of the sample for the material detection and classification. A degree of selectivity at any excitation frequency is enabled for the dielectric sensing method from the manner in which the complex dielectric constant of a material affects the resonance pattern of the resonator with respect to shift in resonance frequency and the change in line width. By selecting the excitation frequencies to generally correspond to one of the resonance frequencies of the sample material under test, the degree of selectivity and the sensitivity of detection are enhanced.


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