The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
May. 26, 2004
Masayoshi Shimamura, Kanagawa, JP;
Kenji Fujishima, Kanagawa, JP;
Naoki Okamoto, Shizuoka, JP;
Yasutaka Akashi, Kanagawa, JP;
Satoshi Otake, Shizuoka, JP;
Kazunori Saiki, Kanagawa, JP;
Yasuhide Goseki, Kanagawa, JP;
Masayoshi Shimamura, Kanagawa, JP;
Kenji Fujishima, Kanagawa, JP;
Naoki Okamoto, Shizuoka, JP;
Yasutaka Akashi, Kanagawa, JP;
Satoshi Otake, Shizuoka, JP;
Kazunori Saiki, Kanagawa, JP;
Yasuhide Goseki, Kanagawa, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
The present invention relates to a developer carrying member for carrying a developer having at least a substrate and a resin-coated layer formed on the surface of the substrate. The developer carrying member is the one which carries a one-component developer to visualize the electrostatic latent image carried by the electrostatic latent image carrying member, the resin-coated layer contains at least a binder resin, graphitized particles and roughing particles, the graphitized particles has 0.20 to 0.95 of graphitization degree (p (002)), and wherein in the surface configuration of the resin-coated layer as measured by use of focusing optical laser, the volume (B) of a microtopographical region defined by a certain area (A) of the microtopographical region without convexity formed by the roughing particles meets the following relationship 4.5≦B/A≦6.5, and the resin-coated layer has 0.9 to 2.5 μm of arithmetic mean roughness (Ra).