The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Oct. 25, 2005
Randy St. Germain, Fargo, ND (US);
Randy St. Germain, Fargo, ND (US);
Dakota Techologies, Inc., Fargo, ND (US);
Abstract
A method for characterizing contaminants within sediment comprising positioning a sampler in a continuous manner within the sediment, exposing the sampler to the sediment for a dwell time, retrieving the sampler, and analyzing the sampler. The sampler is exposed to the sediment for a sufficient period of time to allow at least one analyte of interest to permeate the sampler. The sampler may be analyzed using fluorescence and/or gas chromatography/mass spectrometry to determine contamination versus sampler length. The contamination versus sampler length may be converted to contamination versus depth or contamination versus horizontal position.