The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2007
Filed:
Jun. 03, 2005
Takezou Hatanaka, Ibaraki, JP;
Yasunori Sugihara, Ibaraki, JP;
Junji Yoshida, Ibaraki, JP;
Yukiko Azumi, Ibaraki, JP;
Yuuki Kagehisa, Ibaraki, JP;
Takezou Hatanaka, Ibaraki, JP;
Yasunori Sugihara, Ibaraki, JP;
Junji Yoshida, Ibaraki, JP;
Yukiko Azumi, Ibaraki, JP;
Yuuki Kagehisa, Ibaraki, JP;
Nitto Denki Corporation, Osaka, JP;
Abstract
An impact test apparatus includes a holding device for holding a test piece at an arbitrary holding force, an impact applying device for applying an impact force to the test piece held by the holding device, a force sensor for sensing the impact force applied to the test piece by the impact applying device, a high-speed camera for detecting a displacement of the test piece when applied with the impact force by the impact applying device, and an output device for synchronizing a signal from the force sensor with a signal from the high-speed camera and outputting an impact stress-strain characteristic curve when the impact force is applied to the test piece.