The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Feb. 25, 2004
Michael L. Combs, Essex Junction, VT (US);
Dale B. Grosch, Burlington, VT (US);
Toshiharu Saitoh, South Burlington, VT (US);
Guy M. Vanzo, Westford, VT (US);
Michael L. Combs, Essex Junction, VT (US);
Dale B. Grosch, Burlington, VT (US);
Toshiharu Saitoh, South Burlington, VT (US);
Guy M. Vanzo, Westford, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of testing and repairing an integrated circuit having a total number of fuses for effecting repair of the integrated circuit. The method including: testing a memory array with a set of tests and reserving a first number of the total number of fuses for use in repairing the memory array based on results of the first set of tests; and shmoo testing the memory array by incrementing, decrementing or incrementing and decrementing values of a test parameter until a minimum or maximum value of the test parameter is reached that utilizes a second number of the total number of fuses for use in repairing the memory array to operate at the minimum or maximum value of the test parameter.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile