The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Dec. 04, 2002
Applicants:

Kentaro Kurinami, Tokyo, JP;

Yoshifumi Sakai, Tokyo, JP;

Takashi Oshiro, Tokyo, JP;

Tatsuya Hasegawa, Tokyo, JP;

Inventors:

Kentaro Kurinami, Tokyo, JP;

Yoshifumi Sakai, Tokyo, JP;

Takashi Oshiro, Tokyo, JP;

Tatsuya Hasegawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tabular form screen on which input fields for a parameter and a set value can be added is used as a condition input screen. In a test pattern control part, set values of different parameter groups inputted via the condition input screen are arbitrarily combined, one set value group from each parameter group being selected for one combination, to automatically generate test patterns and parameter files which are information on the set values. An execution control section can control a server and a client terminal of an information processing system to execute performance tests successively only with one input operation based on the generated parameter files.


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