The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Nov. 21, 2002
Applicants:

Fabio Casati, Palo Alto, CA (US);

Ming-chien Shan, Saratoga, CA (US);

Vijay Machiraju, Mountain View, CA (US);

Inventors:

Fabio Casati, Palo Alto, CA (US);

Ming-Chien Shan, Saratoga, CA (US);

Vijay Machiraju, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A platform and method for monitoring and analyzing data is disclosed and which includes at least one measurement logic which converts service execution data having a plurality of elements into a measure, and wherein a subset of the elements of the service execution data is identified as a context; a metric which identifies an aspect of a business that a user wishes to monitor and analyze, and wherein the metric has a predetermined data type; and a meter which defines the measurement logic used to compute the measures for use with the metric and the subset of the elements within the context.


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