The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Mar. 31, 2006
Applicant:

Neil Kenneth Thorne, Finchley, GB;

Inventor:

Neil Kenneth Thorne, Finchley, GB;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Delays through components of a programmable device are determined transparently to the user through the use of mimic paths. For each delay path to be measured, at least one mimic path is created that has similar components and characteristics to the actual path to be measured. A signal fed through this mimic path will experience similar delay to a signal passing through the actual path, which can be affected by temperature and voltage variations during operation. A swept clock signal can be passed to a register latching the mimic signal data, producing output that can be fed to lead/lag logic to determine a current value of the delay through the mimic path. This delay can be compared to a previous delay determination to approximate an adjustment to be made to a sampling clock used to latch the actual data into the appropriate register at the middle of the latching window.


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