The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Nov. 17, 2004
Applicants:

Mark I. Zhodzishsky, Moscow, RU;

Sergey Yudanov, Moscow, RU;

Victor A. Prasolov, Moscow, RU;

Victor A. Veitsel, Moscow, RU;

Inventors:

Mark I. Zhodzishsky, Moscow, RU;

Sergey Yudanov, Moscow, RU;

Victor A. Prasolov, Moscow, RU;

Victor A. Veitsel, Moscow, RU;

Assignee:

Topcon GPS, LLC, Paramus, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for estimating the changing frequency of a signal received by a satellite receiver from, illustratively, positioning system satellites is disclosed that enables a more accurate measurement of the change in frequency of that signal due to movement of the satellite receiver relative to those satellites. The system includes a PLL having a numerically controlled oscillator (NCO) and a filter of frequency estimates (FFE). In operation, an analog signal is received at the satellite receiver and the PLL tracks the changing signal frequency and outputs non-smoothed frequency estimates into the FFE. The FFE then smoothes noise in the signal to produce a more accurate smoothed frequency estimate of the input signal. Comparing multiple estimates over time allows Doppler shift of the signal frequency received by the satellite receiver to be calculated more precisely, thus resulting in more accurate satellite receiver velocity vector determinations and, hence, position measurements.


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