The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
May. 19, 2005
Applicants:
Dimitry Gorinevsky, Palo Alto, CA (US);
Grant A. Gordon, Peoria, AZ (US);
Inventors:
Dimitry Gorinevsky, Palo Alto, CA (US);
Grant A. Gordon, Peoria, AZ (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for estimating damage to a structure is provided. The method includes collecting a plurality of damage estimates over time and filtering the plurality of damage estimates with spatio-temporal filters. The method also includes generating an enhanced damage estimate based on the filtered damage estimate. In other embodiments, a damage estimate system and a computer readable medium having instructions embodied thereon for a method for estimating damage to a structure are provided.