The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Jun. 15, 2004
Thomas Arthur Bett, Oshkosh, WI (US);
Tanakon Ungpiyakul, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Michelle Reneé Irwin, Neenah, WI (US);
Jeremy Brian Cannady, North Augusta, SC (US);
Babe Bedenbaugh, Leesville, SC (US);
Thomas Arthur Bett, Oshkosh, WI (US);
Tanakon Ungpiyakul, Neenah, WI (US);
Walter Caswell Reade, Appleton, WI (US);
Michelle Reneé Irwin, Neenah, WI (US);
Jeremy Brian Cannady, North Augusta, SC (US);
Babe Bedenbaugh, Leesville, SC (US);
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
Analyzing an event chronology record to permit identification of periods of a production sequence that correspond to a high probability of failure. Systems and methods include receiving an event chronology for a particular machine in the production sequence and for a particular time interval. A reliability analysis system accesses process flow information to determine whether a particular event in the event chronology is related to a subsequent adverse event within a predefined event window.