The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Nov. 27, 2001
Applicant:

Richard C. Walker, Palo Alto, CA (US);

Inventor:

Richard C. Walker, Palo Alto, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a multi-phase sampling system in which each sampler samples a transition and data of an incoming data signal. By enabling each sampler to sample a transition in addition to data of the incoming data signal, phase errors associated with each of the samplers can be determined. The phase error determinations provide valuable information that can be used 1) to correct the phase errors of the system sampling the incoming data signal, 2) to correct the phase errors of a multi-phase system that is transmitting the incoming data signal, and/or 3) to correct the phase errors of both a multi-phase system that is sampling an incoming data signal and of a multi-phase system that is transmitting the data signal.


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