The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Dec. 04, 2002
Applicants:

Yoichiro Sako, Tokyo, JP;

Tatsuya Inokuchi, Tokyo, JP;

Tomihiro Nakagawa, Kanagawa, JP;

Yoriaki Kanada, Kanagawa, JP;

Yoshinobu Usui, Kanagawa, JP;

Akiya Saito, Kanagawa, JP;

Inventors:

Yoichiro Sako, Tokyo, JP;

Tatsuya Inokuchi, Tokyo, JP;

Tomihiro Nakagawa, Kanagawa, JP;

Yoriaki Kanada, Kanagawa, JP;

Yoshinobu Usui, Kanagawa, JP;

Akiya Saito, Kanagawa, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided for recording medium having a substrate on which first data and second data are recorded as a protrusion/depression pattern and a reflective layer that is provided on a surface having the protrusion/depression pattern. Laser light is radiated to the reflective layer to change the protrusion/depression pattern of the second data, and third data used for identifying the recording medium is additionally recorded at a predetermined position on the recording medium.


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