The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Jul. 05, 2004
Applicants:

Ralph Kurt, Eindhoven, NL;

Gert Wim 't Hooft, Eindhoven, NL;

Coen Theodorus Hubertus Fransiscus Liedenbaum, Eindhoven, NL;

Robert Frans Maria Hendriks, Eindhoven, NL;

Inventors:

Ralph Kurt, Eindhoven, NL;

Gert Wim 'T Hooft, Eindhoven, NL;

Coen Theodorus Hubertus Fransiscus Liedenbaum, Eindhoven, NL;

Robert Frans Maria Hendriks, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical diffraction element () comprises a diffraction layer () which is divided into diffraction strips () alternating with intermediate strips (). The diffraction strips comprise nano-elements () which are aligned in one direction and absorb radiation (b) which is linearly polarized in this direction. The diffraction element may be a linear or two-dimensional grating () or a Fresnel lens (). The polarization-sensitive grating can be used in optical systems in which only radiation with a specific polarization direction should be diffracted, or in an optical record carrier to allow reading of an information structure with high spatial frequencies.


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