The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Apr. 25, 2005
Applicants:

Luca Crippa, Busnago, IT;

Miriam Sangalli, Carugate, IT;

Salvatrice Scommegna, Cornate d'Adda Fr. Porto, IT;

Rino Micheloni, Turate, IT;

Inventors:

Luca Crippa, Busnago, IT;

Miriam Sangalli, Carugate, IT;

Salvatrice Scommegna, Cornate d'Adda Fr. Porto, IT;

Rino Micheloni, Turate, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianaza (MI), IT;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/10 (2006.01); G05F 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A trimming structure for trimming functional parameters of an Integrated Circuit—IC—() includes a first () and at least one second functional blocks () with which a first (Vrg,a) and at least one second IC functional parameters (Vrg,b, . . . ,Vrg,n) are respectively associated. The trimming structure includes respective trimmable circuit structures () included in the first and at least one second functional blocks, and trimming configuration storage () for storing trimming configurations for the trimmable circuit structures. A change in the trimming configuration of the first functional block causes a corresponding change in the trimming configuration of the second functional block. Further, a change in the second IC functional parameter in response to the corresponding change in the trimming configuration of the second functional block is proportional to the change in the first IC functional parameter consequent to the change in the trimming configuration of the first functional block.


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