The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Jun. 03, 2005
Applicants:

Shinji Fukumoto, Mishima-gun, JP;

Katsushi Tara, Kyoto, JP;

Tadayoshi Nakatsuka, Osaka, JP;

Tomohiko Nakamura, Osaka, JP;

Inventors:

Shinji Fukumoto, Mishima-gun, JP;

Katsushi Tara, Kyoto, JP;

Tadayoshi Nakatsuka, Osaka, JP;

Tomohiko Nakamura, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01P 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor apparatus is provided which makes it possible to reduce the number of control terminals required for switching through paths of a high frequency signal, simplify the circuit configuration for controlling the terminals, improve an isolation characteristic between on path and off path of a through FET, and obtain a sufficiently high isolation. In this semiconductor apparatus, one specific through FET and each of shunt FETs connected to each of through FETs other than the one specific through FET are simultaneously turned on in response to the same control signal inputted to the same control terminal. Thus, when a high frequency signal leaks from an output terminal to the signal path of the through FET having been turned on, through the signal paths of the through FETs having been turned off, the high frequency signal can be released to GND through the shunt FET having been turned on.


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