The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Feb. 01, 2006
Hong-jun Lee, Suwon, KR;
Yong-gyu Chu, Seoul, KR;
Hong-jun Lee, Suwon, KR;
Yong-gyu Chu, Seoul, KR;
Abstract
A semiconductor test circuit is installed inside a semiconductor device to measure the state of at least one electrical signal of the semiconductor device, and includes first, second, and Nth signal selecting units (where N is an integer greater than 2). The first signal selecting unit either outputs a first electrical signal received from a first terminal or provides a high impedance state to a pad connected to a second terminal in response to a first control signal. The second signal selecting unit either outputs a second electrical signal received from a first terminal or provides a high impedance state to the pad connected to a second terminal in response to a second control signal. The Nth signal selecting unit either outputs an Nth electrical signal (N is an integer) received from a first terminal or provides a high impedance state to the pad connected to the second terminal in response to an Nth control signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile