The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2007

Filed:

Jun. 21, 2002
Applicants:

Lawrence R. Shea, Charlotte, NC (US);

Douglas G. Summers, Sunnyvale, CA (US);

Richard O. Hilson, Sunnyvale, CA (US);

Inventors:

Lawrence R. Shea, Charlotte, NC (US);

Douglas G. Summers, Sunnyvale, CA (US);

Richard O. Hilson, Sunnyvale, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H 21/04 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

Array assay devices and methods for using the same in array based assays are provided. The subject devices are characterized by having a base dimensioned to hold a substrate having at least one array, a cover dimensioned to cover the substrate and a snap-fit for holding the cover and the base together to enclose a space between the base and the cover. The subject invention also includes methods for performing an array assay. In the subject methods, a subject device is provided and a substrate having at least one array is positioned on the base. The snap-fit is engaged to hold the cover and the base together to enclose a space between the base and the cover. Next, a sample is contacted with the at least one array and an array assay is performed. The subject invention also includes kits which include the subject devices.


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