The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Dec. 02, 2004
Applicant:
William Russell Whitney, Iv, Boise, ID (US);
Inventor:
William Russell Whitney, IV, Boise, ID (US);
Assignee:
Proclarity Corporation, Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
(N+Q) dimensions of data can be analyzed in an N-dimensional native OLAP cube by submitting an (N+Q)-dimensional custom query and converting the (N+Q)-dimensional custom query into an N-dimensional query for submission to the N-dimensional native OLAP cube. An N-dimensional result of the N-dimensional query is provided and converted into an (N+Q)-dimensional result of the (N+Q)-dimensional custom query. The (N+Q) dimensional result is then provided as an answer to the (N+Q) dimensional custom query.