The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Mar. 07, 2005
Frank Geshwind, Madison, CT (US);
Ronald R. Coifman, North Haven, CT (US);
Andreas Coppi, Groton, CT (US);
Gustave L. Davis, Orange, CT (US);
Richard A. Deverse, Kailua Kona, HI (US);
William G. Fateley, Manhattan, KS (US);
Frederick J. Warner, New Haven, CT (US);
Frank Geshwind, Madison, CT (US);
Ronald R. Coifman, North Haven, CT (US);
Andreas Coppi, Groton, CT (US);
Gustave L. Davis, Orange, CT (US);
Richard A. Deverse, Kailua Kona, HI (US);
William G. Fateley, Manhattan, KS (US);
Frederick J. Warner, New Haven, CT (US);
Plain Sight Systems, Inc., Hamden, CT (US);
Abstract
A hyper-spectral analysis method for characterizing or distinguishing diverse elements within hyper-spectral images. A plurality of patches of pixels from within the hyper-spectral images are extracted as being patches around pixels of the elements to be characterized or distinguished. The statistics of spectra for each patch of pixels are computed. A first classifier is computed from frequency-wise standard deviation of the spectra in each patch and a set of second classifiers are computed from principal components of the spectral in each patch. A combined classifier is computed based on the output of the first classifier and at least one of the second classifiers. The elements are characterized or distinguished based on the output of at least one of the classifiers, preferably the combined classifier.