The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2007

Filed:

Mar. 22, 2006
Applicants:

Eugene R Tracy, Williamsburg, VA (US);

Haijian Chen, Williamsburg, VA (US);

William E Cooke, Williamsburg, VA (US);

Inventors:

Eugene R Tracy, Williamsburg, VA (US);

Haijian Chen, Williamsburg, VA (US);

William E Cooke, Williamsburg, VA (US);

Assignee:

College of William and Mary, Williamsburg, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G01J 3/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention described herein details a protocol to improve analysis and peak identification in spectroscopic data. Bayesian methods are used to automatically identify peaks in data sets. After identifying peak shapes, the method tests the hypothesis that a given number of peaks is found within any given data window. If a peak is identified within a given window, then the likelihood function is maximized in order to estimate peak position and amplitude. This process yields a spectrum with high resolution and minimal artifacts. The method described herein is particularly useful for identifying peaks in data sets obtained from spectroscopy.


Find Patent Forward Citations

Loading…