The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Dec. 13, 2002
Applicants:
Takuya Saitou, Musashino, JP;
Shigeru Takezawa, Musashino, JP;
Inventors:
Takuya Saitou, Musashino, JP;
Shigeru Takezawa, Musashino, JP;
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution. In a waveform measuring instrument configured to write measured signal waveforms into a memory after converting the waveforms to digital data, the present invention is characterized by providing an interpolation system which performs interpolation between the above digital data and writing the data obtained after interpolation into the above memory.