The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2007

Filed:

May. 12, 2005
Applicants:

Ronald W. Gamache, East Greenbush, NY (US);

Richard Hosterman, Buskirk, NY (US);

Sarah Pluta, Clifton Park, NY (US);

Inventors:

Ronald W. Gamache, East Greenbush, NY (US);

Richard Hosterman, Buskirk, NY (US);

Sarah Pluta, Clifton Park, NY (US);

Assignee:

TransTech Systems, Inc., Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.


Find Patent Forward Citations

Loading…