The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Mar. 24, 2006
Mikhail Sumetsky, Bridgewater, NJ (US);
Mikhail Sumetsky, Bridgewater, NJ (US);
Fitel USA Corp., Norcross, GA (US);
Abstract
An apparatus and method for performing surface microscopy of an optical device uses an optical fiber taper including a microsphere endpoint as a near field probe. A transmission fiber is disposed adjacent to the microsphere so as to evanescently couple an optical test signal into the microsphere. A series of extremely narrow whispering gallery mode (WGM) resonances are created within the microsphere, with an associated electromagnetic field radiating outward therefrom. The microsphere probe may then be moved over the surface of an optical device being analyzed (or the device translated underneath the microsphere), where any abnormalities in the surface (such as defects, scratches and the like) will perturb the electromagnetic field pattern and be reflected in changes in the measured output power from the microsphere.