The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Apr. 15, 2002
Applicants:
Jeffrey Wayne Eberhard, Albany, NY (US);
Abdalmajeid Musa Alyassin, Niskayuna, NY (US);
Ajay Kapur, Clifton Park, NY (US);
Inventors:
Jeffrey Wayne Eberhard, Albany, NY (US);
Abdalmajeid Musa Alyassin, Niskayuna, NY (US);
Ajay Kapur, Clifton Park, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided a method of analyzing a plurality of views of an object, the object including an edge portion partially extending from a surface of the object into an internal volume of the object, comprising the step of analyzing each acquired view. The step of analyzing each acquired view includes analysis of the edge portion. Preferably, the object comprises breast tissue.