The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Feb. 01, 2005
William Hullinger Huber, Scotia, NY (US);
Colin Richard Wilson, Niskayuna, NY (US);
John Scott Price, Niskayuna, NY (US);
Peter Michael Edic, Albany, NY (US);
Mark Ernest Vermilyea, Niskayuna, NY (US);
William Hullinger Huber, Scotia, NY (US);
Colin Richard Wilson, Niskayuna, NY (US);
John Scott Price, Niskayuna, NY (US);
Peter Michael Edic, Albany, NY (US);
Mark Ernest Vermilyea, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A system and method for forming x-rays. One exemplary system includes a target and electron emission subsystem with a plurality of electron sources. Each of the plurality of electron sources is configured to generate a plurality of discrete spots on the target from which x-rays are emitted. Another exemplary system includes a target, an electron emission subsystem with a plurality of electron sources, each of which generates at least one of the plurality of spots on the target, and a transient beam protection subsystem for protecting the electron emission subsystem from transient beam currents, material emissions from the target, and electric field transients.