The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2007

Filed:

Jun. 14, 2004
Applicants:

Yukio Watanabe, Kyoto, JP;

Tetsuo Ueyama, Nara, JP;

Inventors:

Yukio Watanabe, Kyoto, JP;

Tetsuo Ueyama, Nara, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Regional borderlines that are the borderlines between the first region and the second region on a diffraction grating of an optical pickup partially overlap a group of y-axis parallel borderlines that are borderlines between pattern A and pattern B that are parallel to a direction parallel to the y-axis.


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