The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Mar. 30, 2005
Mikihito Shimoyama, Kiryu, JP;
Takayuki Kawakura, Kiryu, JP;
Tomoyuki Ogawa, Kiryu, JP;
Naohiko Shiga, Kiryu, JP;
Yuichi Yanagita, Kiryu, JP;
Katsuhiro Tanino, Saitama, JP;
Mikihito Shimoyama, Kiryu, JP;
Takayuki Kawakura, Kiryu, JP;
Tomoyuki Ogawa, Kiryu, JP;
Naohiko Shiga, Kiryu, JP;
Yuichi Yanagita, Kiryu, JP;
Katsuhiro Tanino, Saitama, JP;
Mitsuba Corporation, Gunma, JP;
Abstract
Various component parts of a driver circuit for drive sources such as electric motors and clutches, such as relays and FETs as well as the drive sources can be tested by selectively energizing the relays and evaluating the voltage levels of the selected points by using the first and second test voltage detection circuits. This testing process is typically executed before the power up of the drive circuit. The test current is so small that the drive sources would not be inadvertently activated and various components would not be damaged even when there is any faulty component in the driver circuit. When any faulty component is detected in the testing process, the driver circuit may be prevented from being powered up so that any undesired operation of the drive sources or permanent damage to various components owing to such a faulty component may be avoided.