The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Sep. 02, 2005
Weiguo Zhang, Foster City, CA (US);
David M. Kramer, Corte Madera, CA (US);
Weiguo Zhang, Foster City, CA (US);
David M. Kramer, Corte Madera, CA (US);
Toshiba America MRI, Inc., Tustin, CA (US);
Abstract
A method and a system for acquiring diffusion magnetic resonance images with compensation of the effects of eddy currents induced by the diffusion weighting (DW) gradient pulses. Prescan data are first acquired using the same DW sequence to be used for imaging. The prescan data are used to obtain eddy current parameters that model the effects of DW-induced eddy currents under the exact conditions under which DW images are to be acquired. The DW imaging sequence is then slightly modified according to the eddy current parameters and used to acquire DW image data with the effects of DW-induced eddy currents compensated.