The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Apr. 12, 2005
Applicants:
Jung-nam Kim, Suwon-si, KR;
Young-jong Kim, Osan-si, KR;
Inventors:
Jung-Nam Kim, Suwon-si, KR;
Young-Jong Kim, Osan-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Wafer test equipment includes a probe station having a wafer chuck for supporting a wafer, a test head disposed on the probe station, a manipulator for moving the test head to and from an upper surface of the probe station, and an alignment monitoring member for monitoring an alignment of the test head docked to the probe station.
Kim, Jung-Nam. (2007). Wafer test equipment and method of aligning test equipment (U.S. Patent No. 7218097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7218097
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile