The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2007
Filed:
Jan. 21, 2005
Roger Guevremont, Ottawa, CA;
Ragnar Dworschak, Ottawa, CA;
Roger Guevremont, Ottawa, CA;
Ragnar Dworschak, Ottawa, CA;
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
A method of separating ions includes providing a FAIMS analyzer region including an ion inlet orifice for providing ions thereto, and providing a sample holder along a side of the ion inlet orifice that is opposite the FAIMS analyzer. A sample material is applied to the sample holder such that sample material is disposed about first and second points along the sample holder, a distance between the first and second points being greater than a maximum dimension of the ion inlet orifice. The first point is aligned with the ion inlet orifice, and the sample material disposed about the first point is irradiated with laser light of a predetermined wavelength. Next, the sample holder is moved relative to the ion inlet so as to align the second point with the ion inlet orifice, and the sample material disposed about the second point is irradiated with laser light of a predetermined wavelength.