The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Nov. 05, 2004
Applicants:

Dang Yun Yau, Saratoga, CA (US);

Siuki Chan, Cupertino, CA (US);

Inventors:

Dang Yun Yau, Saratoga, CA (US);

Siuki Chan, Cupertino, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an embodiment of the present invention, an integrated circuit ('IC'), such as a field-programmable gate array ('FPGA') or a complex programmable logic device (“CPLD”), has a global clock buffer coupled to a first regional clock buffer through a first global clock spine. A first flip-flop is close to a first end of a first regional clock spine, and is coupled to a circuit block, such as a configurable logic block. The circuit block is coupled to the global clock buffer through a first routing portion and a second routing portion couples the first flip-flop to the circuit block so as to form a first clock ring allowing measurement of a first clock ring delay. In further embodiments, additional clock rings are configured in the IC, allowing measurements of additional clock ring delays. In suitably symmetric devices, skew along the regional clock spine is calculated from the clock ring delays.


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